Invention Grant
- Patent Title: Method for calibrating the crystal-level detection efficiency
- Patent Title (中): 校准晶体级检测效率的方法
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Application No.: US12840627Application Date: 2010-07-21
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Publication No.: US08666710B2Publication Date: 2014-03-04
- Inventor: Tien-Hsiu Tsai , Meei-Ling Jan , Yu-Ching Ni
- Applicant: Tien-Hsiu Tsai , Meei-Ling Jan , Yu-Ching Ni
- Applicant Address: TW Taoyuan County
- Assignee: Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan
- Current Assignee: Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan
- Current Assignee Address: TW Taoyuan County
- Agency: WAPT, PC
- Agent Justin King
- Priority: TW98136868A 20091030
- Main IPC: G06G7/48
- IPC: G06G7/48 ; G06G7/56 ; G06F17/50

Abstract:
The present invention provides a method for calibrating the crystal-level detection efficiency, which is capable of evaluating the influences caused by the penetration effect of the crystals of a scintillation detector so as to calculate the difference of detection efficiency between crystals correctly and thereby calibrate the difference between crystals appropriately such that the quality of the imaging result is improved accordingly. The method of present invention is simple without modifying the hardware design and consequently the design cost, manpower cost and time cost can be reduced.
Public/Granted literature
- US20110106473A1 METHOD FOR CALIBRATING DETECTION EFFICIENCY Public/Granted day:2011-05-05
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