Invention Grant
- Patent Title: Extensible testing system
- Patent Title (中): 可扩展测试系统
-
Application No.: US13149858Application Date: 2011-05-31
-
Publication No.: US08667333B2Publication Date: 2014-03-04
- Inventor: David T. Hill
- Applicant: David T. Hill
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee Address: US DC Washington
- Agent Christopher A. Monsey
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A computer implemented system for testing electronic equipment where a plurality of types of systems can be tested using a single test specification.
Public/Granted literature
- US20120136613A1 EXTENSIBLE TESTING SYSTEM Public/Granted day:2012-05-31
Information query
