Invention Grant
- Patent Title: Semiconductor device and method for validating a state thereof
- Patent Title (中): 用于验证其状态的半导体器件和方法
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Application No.: US12990873Application Date: 2008-05-27
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Publication No.: US08667352B2Publication Date: 2014-03-04
- Inventor: Oleksandr Sakada
- Applicant: Oleksandr Sakada
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2008/052082 WO 20080527
- International Announcement: WO2009/144531 WO 20091203
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A semiconductor device comprises processing logic arranged to execute program instructions. The semiconductor device further comprises signature generation logic arranged to receive at least one value from at least one internal location of the semiconductor device, and to generate a current signature value, based on the at least one received value. Validation logic is arranged to validate the current signature value generated by the signature generation logic. The processing logic is further arranged, upon execution of a signature validation instruction, to enable the validation of the current signature value provided by the validation logic.
Public/Granted literature
- US20110060954A1 SEMICONDUCTOR DEVICE AND METHOD FOR VALIDATING A STATE THEREOF Public/Granted day:2011-03-10
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