Invention Grant
- Patent Title: Automatic data recovery circuit and data error detection circuit
- Patent Title (中): 自动数据恢复电路和数据错误检测电路
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Application No.: US12564247Application Date: 2009-09-22
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Publication No.: US08667364B2Publication Date: 2014-03-04
- Inventor: Jong-Kon Bae , Kyu-Young Chung
- Applicant: Jong-Kon Bae , Kyu-Young Chung
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2008-0094264 20080925
- Main IPC: H03M13/00
- IPC: H03M13/00 ; H04L1/00

Abstract:
An automatic data recovery circuit includes a register, an error detection unit and a data recovery unit. The register stores a register data including an input data and a remainder data generated by a cyclic redundancy check calculation on the input data using a predefined generation polynomial. The error detection unit performs a modular calculation on the register data stored in the register using the predefined generation polynomial to generate an error detection signal indicating whether an error is detected in the register data stored in the register. The data recovery unit recovers the input data when an error is detected in the input data based on the error detection signal and a comparison data generated by comparing the input data stored in the register with a reference voltage using a capacitor.
Public/Granted literature
- US20100077281A1 AUTOMATIC DATA RECOVERY CIRCUIT AND DATA ERROR DETECTION CIRCUIT Public/Granted day:2010-03-25
Information query
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