Embodiments include a method for providing a local maximum operating voltage on an integrated circuit. The method includes determining a gate-to-contact reliability for each of the plurality of regions and calculating a local maximum voltage for each of the plurality of regions based on the gate-to-contact reliability. Based on a determination that the local maximum voltage in one of the plurality of regions is greater than a maximum voltage, the method includes setting the local maximum operating voltage to the maximum voltage. Based on a determination that the local maximum voltage in one of the plurality of regions is less than the maximum voltage, the method includes setting the local maximum operating voltage to the local maximum voltage.