Invention Grant
- Patent Title: Material imaging apparatus
- Patent Title (中): 材料成像装置
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Application No.: US13432400Application Date: 2012-03-28
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Publication No.: US08668395B2Publication Date: 2014-03-11
- Inventor: Hiroshi Mameda , Hiroyuki Furusawa , Shinsuke Ikeno
- Applicant: Hiroshi Mameda , Hiroyuki Furusawa , Shinsuke Ikeno
- Applicant Address: JP Aichi
- Assignee: Elmo Co., Ltd.
- Current Assignee: Elmo Co., Ltd.
- Current Assignee Address: JP Aichi
- Agency: Posz Law Group, PLC
- Priority: JP2011-082419 20110404
- Main IPC: G03B17/02
- IPC: G03B17/02 ; H04N5/225

Abstract:
A material imaging apparatus includes a base, support pillar and imaging camera divided into a camera base and a camera neck. The camera is mounted via a first shaft on the pillar so as to be pivotable between a right horizontal position where an imaging lens is located on a base right side and a left horizontal position where the lens is located on base left side. The camera neck is mounted via a second shaft on the camera base so as to be rotatable between a downwardly vertical position where when the camera assumes the right or left horizontal position, the lens is directed to the base placement surface side and lens optical axis is substantially vertical to the base placement surface, and an upwardly vertical position where the lens is directed to a side opposite the base placement surface and the optical axis assumes a substantially vertical position.
Public/Granted literature
- US20120251091A1 MATERIAL IMAGING APPARATUS Public/Granted day:2012-10-04
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