Invention Grant
- Patent Title: Analyzer
- Patent Title (中): 分析仪
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Application No.: US12381973Application Date: 2009-03-18
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Publication No.: US08668869B2Publication Date: 2014-03-11
- Inventor: Hideki Hirayama
- Applicant: Hideki Hirayama
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2003-197607 20030716
- Main IPC: G01N33/00
- IPC: G01N33/00
Abstract:
Analyzers are described that includes a mode selector for selecting one measurement mode from said plurality of measurement modes; a display for displaying a screen; and a display controller for displaying on said screen a picture representing contents of the measurement mode selected by said mode selector.
Public/Granted literature
- US20090259427A1 Analyzer Public/Granted day:2009-10-15
Information query
