Invention Grant
- Patent Title: Probe pin and an IC socket with the same
- Patent Title (中): 探针和IC插座相同
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Application No.: US13042693Application Date: 2011-03-08
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Publication No.: US08669774B2Publication Date: 2014-03-11
- Inventor: Yuji Kato , Takeyuki Suzuki
- Applicant: Yuji Kato , Takeyuki Suzuki
- Applicant Address: JP Tokyo
- Assignee: Yamaichi Electronics Co., Ltd.
- Current Assignee: Yamaichi Electronics Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2010-090474 20100409
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
The probe pin includes a plunger formed of a sheet metal, and a coil spring unit formed of a metal wire and configured to hold the plunger thereon. In a developed state, the plunger includes first and second portions each of which has an upper contact strip, a wide portion, and a lower contact strip, and which are connected to each other via the wide portions formed in the first and second portions. The plunger is formed in a united manner by folding together the first and second portions along a boundary of the wide portions formed therein to thereby bring at least the wide portions into tight contact with each other.
Public/Granted literature
- US20110248736A1 PROBE PIN AND AN IC SOCKET WITH THE SAME Public/Granted day:2011-10-13
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