Disclosed is a method for operating a test apparatus for an LED lamp. The method includes: forming a self-holding circuit by switching on a first switching means such that an up and down shifter provided in the test apparatus for the LED lamp moves down; moving down and stopping the up and down shifter from a determined initial position to a measurement position; measuring the quality of the LED lamp equipped with the test apparatus for the LED lamp; releasing the self-holding circuit by switching on the second switching means such that the up and down shifter moves up; and moving up and down shifter from the measurement position to the determined initial position.