Invention Grant
- Patent Title: Flow rate measuring device
- Patent Title (中): 流量测量装置
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Application No.: US13516588Application Date: 2010-12-14
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Publication No.: US08671775B2Publication Date: 2014-03-18
- Inventor: Hirokazu Gotou , Aoi Watanabe , Yuji Fujii , Kouichi Takemura , Yuji Nakabayashi
- Applicant: Hirokazu Gotou , Aoi Watanabe , Yuji Fujii , Kouichi Takemura , Yuji Nakabayashi
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Brinks Gilson & Lione
- Priority: JP2009-284700 20091216
- International Application: PCT/JP2010/007260 WO 20101214
- International Announcement: WO2011/074248 WO 20110623
- Main IPC: G01F1/66
- IPC: G01F1/66

Abstract:
When a flow rate is equal to or more than a reference flow rate, a reference voltage is changed to a level capable of measuring stably to thereby realize the improvement of measurement accuracy at the time of a large amount of flow rate. A flow rate determination means compares a flow rate calculated by a flow rate calculation means with the reference flow rate. When the calculated flow rate is larger than the reference flow rate, the reference voltage set by a reference voltage setting means is changed, whereby the zero cross point can be detected stably at the portion where the degree of the influence of the change in the amplitude of the received signal is small. Thus, it is possible to provide a flow rate measuring device capable of measuring a flow rate stably with high accuracy even when a fluid flow is disturbed due to a large amount of flow rate.
Public/Granted literature
- US20120255368A1 FLOW RATE MEASURING DEVICE Public/Granted day:2012-10-11
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