Invention Grant
- Patent Title: Apparatus for measuring ocular axial length
- Patent Title (中): 用于测量眼轴长度的装置
-
Application No.: US12977520Application Date: 2010-12-23
-
Publication No.: US08672481B2Publication Date: 2014-03-18
- Inventor: Noriji Kawai , Masakazu Endo
- Applicant: Noriji Kawai , Masakazu Endo
- Applicant Address: JP Aichi
- Assignee: Nidek Co., Ltd.
- Current Assignee: Nidek Co., Ltd.
- Current Assignee Address: JP Aichi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2009-299155 20091229
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/00 ; A61B3/10

Abstract:
An object of one aspect of the present invention is to obtain a measurement value in accordance with the condition of a crystalline lens of an examinee's eye. An apparatus for measuring ocular axial length includes: a measuring unit which irradiates measurement waves toward a fundus of the examinee's eye, and calculates the ocular axial length of the examinee's eye based on detection signals obtained from reflected waves including waves reflected from the fundus; and a determining unit which acquires reflection information related to an anterior segment of the examinee's eye, extracts reflection signals corresponding to a reflection object between a cornea and a posterior capsule of a crystalline lens based on the acquired reflection information, and determines whether the examinee's eye is a phakic eye or an IOL eye based on the extracted reflection signals.
Public/Granted literature
- US20110157554A1 APPARATUS FOR MEASURING OCULAR AXIAL LENGTH Public/Granted day:2011-06-30
Information query