Invention Grant
US08677338B2 Data dependence testing for loop fusion with code replication, array contraction, and loop interchange
有权
用于循环融合的数据依赖性测试,具有代码复制,阵列收缩和循环交换
- Patent Title: Data dependence testing for loop fusion with code replication, array contraction, and loop interchange
- Patent Title (中): 用于循环融合的数据依赖性测试,具有代码复制,阵列收缩和循环交换
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Application No.: US12133285Application Date: 2008-06-04
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Publication No.: US08677338B2Publication Date: 2014-03-18
- Inventor: John L. Ng , Rakesh Krishnaiyer , Alexander Y. Ostanevich
- Applicant: John L. Ng , Rakesh Krishnaiyer , Alexander Y. Ostanevich
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Caven & Aghevli LLC
- Main IPC: G06F9/45
- IPC: G06F9/45

Abstract:
Methods and apparatus to data dependence testing for loop fusion, e.g., with code replication, array contraction, and/or loop interchange, are described. In one embodiment, a compiler may optimize code for efficient execution during run-time by testing for dependencies associated with improving memory locality through code replication in loops that enable various loop transformations. Other embodiments are also described.
Public/Granted literature
- US20090307675A1 DATA DEPENDENCE TESTING FOR LOOP FUSION WITH CODE REPLICATION, ARRAY CONTRACTION, AND LOOP INTERCHANGE Public/Granted day:2009-12-10
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