Invention Grant
- Patent Title: Systems and methods providing efficient detection of back-scattered illumination in modulation transfer microscopy or micro-spectroscopy
- Patent Title (中): 在调制转移显微镜或微光谱学中提供有效检测背散射照明的系统和方法
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Application No.: US13719717Application Date: 2012-12-19
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Publication No.: US08681331B2Publication Date: 2014-03-25
- Inventor: Sunney Xiaoliang Xie , Christian W. Freudiger , Brian G. Saar
- Applicant: President and Fellows of Harvard College
- Applicant Address: US MA Cambridge
- Assignee: President and Fellows of Harvard College
- Current Assignee: President and Fellows of Harvard College
- Current Assignee Address: US MA Cambridge
- Agency: Gesmer Updegrove LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/53

Abstract:
A microscopy or micro-spectroscopy system is disclosed that includes a first light source, a second light source, a modulator, an optical assembly and a processor. The first light source is for providing a first illumination field at a first optical frequency ω1 and the second light source is for providing a second illumination field at a second optical frequency ω2. The modulator is for modulating a property of the second illumination field at a modulation frequency f of at least 100 kHz to provide a modulated second illumination field. The optical assembly includes focusing optics and an optical detector system. The focusing optics is for directing and focusing the first illumination field and the modulated second illumination field through an objective lens toward the common focal volume along an excitation path.
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