Invention Grant
US08681569B2 Method for reading data stored in a flash memory according to a threshold voltage distribution and memory controller and system thereof 有权
根据阈值电压分布读取存储在闪速存储器中的数据的方法及其系统

  • Patent Title: Method for reading data stored in a flash memory according to a threshold voltage distribution and memory controller and system thereof
  • Patent Title (中): 根据阈值电压分布读取存储在闪速存储器中的数据的方法及其系统
  • Application No.: US13402550
    Application Date: 2012-02-22
  • Publication No.: US08681569B2
    Publication Date: 2014-03-25
  • Inventor: Tsung-Chieh Yang
  • Applicant: Tsung-Chieh Yang
  • Applicant Address: TW Jhubei
  • Assignee: Silicon Motion, Inc.
  • Current Assignee: Silicon Motion, Inc.
  • Current Assignee Address: TW Jhubei
  • Agency: Wang Law Firm, Inc.
  • Agent Li K. Wang; Stephen Hsu
  • Main IPC: G11C16/04
  • IPC: G11C16/04
Method for reading data stored in a flash memory according to a threshold voltage distribution and memory controller and system thereof
Abstract:
A method for reading data stored in a flash memory. The flash memory comprises a plurality of memory cells and each memory cell has a particular threshold voltage The method includes: obtaining a first threshold voltage distribution representing threshold voltages of a first group of the memory cells; obtaining a second threshold voltage distribution representing threshold voltages of a second group of the memory cells, wherein the second threshold voltage distribution is different from the first threshold voltage distribution, and the first group of the memory cells comprises at least a part of the second group of the memory cells; and controlling the flash memory to perform at least one read operation upon the first group of the memory cells according to the second threshold voltage distribution.
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