Invention Grant
- Patent Title: Defect detection using pattern matching on detected data
- Patent Title (中): 检测数据使用模式匹配进行缺陷检测
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Application No.: US13180723Application Date: 2011-07-12
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Publication No.: US08683277B1Publication Date: 2014-03-25
- Inventor: Nedeljko Varnica , Gregory Burd
- Applicant: Nedeljko Varnica , Gregory Burd
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G01R31/28 ; G06F11/00
Abstract:
Systems and methods for detection of defects on a magnetic storage medium. The method comprises: (1) receiving incoming detected data generated by reading information recorded on a storage medium, (2) identifying the defects in the storage medium based on comparison between the incoming detected data and a data pattern wherein the data pattern is predetermined; and (3) storing location information indicative of locations of the defects on the storage medium.
Information query
