Invention Grant
- Patent Title: Semiconductor device, information processing apparatus, and method of detecting error
- Patent Title (中): 半导体装置,信息处理装置及误差检测方法
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Application No.: US13404669Application Date: 2012-02-24
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Publication No.: US08683308B2Publication Date: 2014-03-25
- Inventor: Nina Tsukamoto , Toshihiro Tomozaki , Terumasa Haneda
- Applicant: Nina Tsukamoto , Toshihiro Tomozaki , Terumasa Haneda
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2011-101887 20110428
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G08C25/00 ; H03M13/00 ; H04L1/00

Abstract:
Each of (n−1) 2-bit checking units, where n is an integer larger than or equal to 4, receives n-bit redundant encoded data generated from 1-bit input data, and outputs 2-bit check data based on a result of comparison between bits of the encoded data, combinations of the bits differing in each comparison. An all-bit checking unit outputs all-bit check data based on exclusive ORs of all-bit of the encoded data. An error detecting unit detects errors in the encoded data on the basis of the (n−1) sets of 2-bit check data and the all-bit check data, and outputs the input data on the basis of the result of error detection.
Public/Granted literature
- US20120278688A1 SEMICONDUCTOR DEVICE, INFORMATION PROCESSING APPARATUS, AND METHOD OF DETECTING ERROR Public/Granted day:2012-11-01
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