Invention Grant
- Patent Title: Power circuit analysis apparatus and method that outputs an analysis result for segmented regions of the power circuit
- Patent Title (中): 电源电路分析装置和方法,输出电源电路分段区域的分析结果
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Application No.: US13157418Application Date: 2011-06-10
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Publication No.: US08683403B2Publication Date: 2014-03-25
- Inventor: Miki Terabe , Yasuo Amano
- Applicant: Miki Terabe , Yasuo Amano
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2010-139119 20100618
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A power circuit analysis apparatus includes a segmentation unit that segments an analysis target region in a power circuit included in an analysis target circuit into a plurality of segmented regions, and an analysis unit that outputs an analysis result of the power circuit with respect to each of the plurality of segmented regions on a basis of a consumption current value in the segmented region and a number of via holes formed in each interlayer connecting power line wirings in upper and lower layers to each other in the segmented region.
Public/Granted literature
- US20110313709A1 POWER CIRCUIT ANALYSIS APPARATUS AND METHOD Public/Granted day:2011-12-22
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