Invention Grant
US08683403B2 Power circuit analysis apparatus and method that outputs an analysis result for segmented regions of the power circuit 失效
电源电路分析装置和方法,输出电源电路分段区域的分析结果

  • Patent Title: Power circuit analysis apparatus and method that outputs an analysis result for segmented regions of the power circuit
  • Patent Title (中): 电源电路分析装置和方法,输出电源电路分段区域的分析结果
  • Application No.: US13157418
    Application Date: 2011-06-10
  • Publication No.: US08683403B2
    Publication Date: 2014-03-25
  • Inventor: Miki TerabeYasuo Amano
  • Applicant: Miki TerabeYasuo Amano
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Fujitsu Patent Center
  • Priority: JP2010-139119 20100618
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Power circuit analysis apparatus and method that outputs an analysis result for segmented regions of the power circuit
Abstract:
A power circuit analysis apparatus includes a segmentation unit that segments an analysis target region in a power circuit included in an analysis target circuit into a plurality of segmented regions, and an analysis unit that outputs an analysis result of the power circuit with respect to each of the plurality of segmented regions on a basis of a consumption current value in the segmented region and a number of via holes formed in each interlayer connecting power line wirings in upper and lower layers to each other in the segmented region.
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