Invention Grant
- Patent Title: Phase change memory cell
- Patent Title (中): 相变存储单元
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Application No.: US12913117Application Date: 2010-10-27
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Publication No.: US08685783B2Publication Date: 2014-04-01
- Inventor: Ming-Huei Shen , Tsun Kai Tsao , Shih-Chang Liu , Chia-Shiung Tsai
- Applicant: Ming-Huei Shen , Tsun Kai Tsao , Shih-Chang Liu , Chia-Shiung Tsai
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
On a first structure having a first dielectric layer, a second dielectric layer, and a third dielectric layer a crown is formed through the third dielectric layer and the second dielectric layer. A fourth dielectric layer is deposited over the first structure and thereby is over the crown. A portion of the fourth dielectric layer is removed to form a first spacer having a remaining portion of the fourth dielectric layer. A portion of the third electric layer is also removed during the removal of the portion the fourth dielectric layer, resulting in a second spacer having a remaining portion of the third dielectric layer. A second structure is thereby formed. A phase change material layer is deposited over the second structure. An electrode layer is deposited over the phase change layer. Portions of the electrode layer and the phase change layer are removed by a chemical-mechanical-polishing process to form a phase change region having a remaining portion of the phase change layer and to form an electrode region having a remaining portion of the electrode layer.
Public/Granted literature
- US20120104339A1 PHASE CHANGE MEMORY CELL Public/Granted day:2012-05-03
Information query
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