Invention Grant
US08685833B2 Stress reduction means for warp control of substrates through clamping
有权
应力减小装置用于通过夹紧来对基底进行翘曲控制
- Patent Title: Stress reduction means for warp control of substrates through clamping
- Patent Title (中): 应力减小装置用于通过夹紧来对基底进行翘曲控制
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Application No.: US13437309Application Date: 2012-04-02
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Publication No.: US08685833B2Publication Date: 2014-04-01
- Inventor: Vijayeshwar D. Khanna , Sri M. Sri-Jayantha
- Applicant: Vijayeshwar D. Khanna , Sri M. Sri-Jayantha
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Louis J. Percello, Esq.
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
A method is provided for bonding a semiconductor chip to a packaging substrate while minimizing the variation in the solder ball heights and controlling the stress in the solder balls and the stress in the packaging substrate. During the solder reflow, the warp of the packaging substrate, including the absolute warp, thermal warp, and substrate to substrate variations of the warp, is constrained at a minimal level by providing a clamping constraint to the packaging substrate. During cool down of the solder balls, the stresses and strains of the solder joints are maintained at levels that do not cause tear of the solder joints or breakage of the packaging substrate by removing the clamping constraint. Thus, the bonding process provides both uniform solder height with minimized solder non-wets and stress minimization of the solder balls and the packaging substrate.
Public/Granted literature
- US20130260534A1 STRESS REDUCTION MEANS FOR WARP CONTROL OF SUBSTRATES THROUGH CLAMPING Public/Granted day:2013-10-03
Information query
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