Invention Grant
- Patent Title: Microarray characterization system and method
- Patent Title (中): 微阵列表征系统及方法
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Application No.: US12999639Application Date: 2009-06-23
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Publication No.: US08686376B2Publication Date: 2014-04-01
- Inventor: Reinhold Wimberger-Friedl , Peter Dirksen , Marius Iosif Boamfa , Erik Martinus Hubertus Petrus Van Dijk
- Applicant: Reinhold Wimberger-Friedl , Peter Dirksen , Marius Iosif Boamfa , Erik Martinus Hubertus Petrus Van Dijk
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08158863 20080624; EP09159979 20090512
- International Application: PCT/IB2009/052683 WO 20090623
- International Announcement: WO2009/156942 WO 20091230
- Main IPC: F21V9/16
- IPC: F21V9/16

Abstract:
A system for detecting a plurality of analytes in a sample includes an aperture array and a lens array for generating and focusing a plurality of excitation sub-beams on different sub-regions of a substrate. These sub-regions can be provided with different binding sites for binding different analytes in the sample. By detecting the different luminescent responses in a detector, the presence or amount of different analytes can be determined simultaneously. Alternatively or in addition, collection of the luminescence radiation can be performed using the lens array for directly collecting the luminescence response and for guiding the collected luminescence response to corresponding apertures. The excitation sub-beams may be focused at the side of the substrate opposite of the lens array, and an immersion fluid is provided between the lens array and the substrate to increase the collection efficiency of the luminescence radiation.
Public/Granted literature
- US20110101243A1 MICROARRAY CHARACTERIZATION SYSTEM AND METHOD Public/Granted day:2011-05-05
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