Invention Grant
- Patent Title: Semiconductor device having oxide semiconductor transistor
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Application No.: US12894911Application Date: 2010-09-30
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Publication No.: US08686413B2Publication Date: 2014-04-01
- Inventor: Shunpei Yamazaki , Kei Takahashi , Yoshiaki Ito
- Applicant: Shunpei Yamazaki , Kei Takahashi , Yoshiaki Ito
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2009-235604 20091009
- Main IPC: H01L29/12
- IPC: H01L29/12 ; H01L29/04 ; H01L31/036

Abstract:
It is an object to provide a semiconductor device having a new productive semiconductor material and a new structure. The semiconductor device includes a first conductive layer over a substrate, a first insulating layer which covers the first conductive layer, an oxide semiconductor layer over the first insulating layer that overlaps with part of the first conductive layer and has a crystal region in a surface part, second and third conductive layers formed in contact with the oxide semiconductor layer, an insulating layer which covers the oxide semiconductor layer and the second and third conductive layers, and a fourth conductive layer over the insulating layer that overlaps with part of the oxide semiconductor layer.
Public/Granted literature
- US09006728B2 Semiconductor device having oxide semiconductor transistor Public/Granted day:2015-04-14
Information query
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