Invention Grant
- Patent Title: Memory device
- Patent Title (中): 内存设备
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Application No.: US13425674Application Date: 2012-03-21
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Publication No.: US08686486B2Publication Date: 2014-04-01
- Inventor: Kiyoshi Kato , Toshihiko Saito
- Applicant: Kiyoshi Kato , Toshihiko Saito
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2011-078937 20110331; JP2011-108885 20110514
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L29/94 ; H01L29/10 ; H01L29/12 ; H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
It is an object to provide a memory device where an area occupied by a memory cell is small, and moreover, a memory device where an area occupied by a memory cell is small and a data holding period is long. A memory device includes a bit line, a capacitor, a first insulating layer provided over the bit line and including a groove portion, a semiconductor layer, a second insulating layer in contact with the semiconductor layer, and a word line in contact with the second insulating layer. Part of the semiconductor layer is electrically connected to the bit line in a bottom portion of the groove portion, and another part of the semiconductor layer is electrically connected to one electrode of the capacitor in a top surface of the first insulating layer.
Public/Granted literature
- US20120248434A1 MEMORY DEVICE Public/Granted day:2012-10-04
Information query
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