Invention Grant
- Patent Title: Lateral double diffused MOS device and method for manufacturing the same
- Patent Title (中): 横向双扩散MOS器件及其制造方法
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Application No.: US13038876Application Date: 2011-03-02
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Publication No.: US08686498B2Publication Date: 2014-04-01
- Inventor: Mueng-Ryul Lee
- Applicant: Mueng-Ryul Lee
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2010-0019088 20100303
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/66 ; H01L31/101 ; H01L31/113

Abstract:
A semiconductor device is provided. The semiconductor device includes a gate on a substrate, a source region at a first side of the gate, a first conductive type body region under the source region, a second conductive type drain region at a second side of the gate, a device isolation region in the substrate between the source region and the drain region and overlapping part of the gate, and a first buried layer extending in a direction from the source region to the drain region, the first buried layer under the body region, overlapping part of the device isolation region, and not overlapping the drain region.
Public/Granted literature
- US20110215402A1 SEMICONDUCTOR DEVICE Public/Granted day:2011-09-08
Information query
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