Invention Grant
- Patent Title: Semiconductor chip stacking for redundancy and yield improvement
- Patent Title (中): 半导体芯片堆叠冗余和产量提高
-
Application No.: US13607680Application Date: 2012-09-08
-
Publication No.: US08686559B2Publication Date: 2014-04-01
- Inventor: Kerry Bernstein , Philip G. Emma , Michael Ignatowski
- Applicant: Kerry Bernstein , Philip G. Emma , Michael Ignatowski
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L23/34
- IPC: H01L23/34

Abstract:
A stacked semiconductor chip comprising multiple unit chips contains multiple instances of a first chip component that have a low yield and are distributed among the multiple unit chips. An instance of the first chip component within a first unit chip is logically paired with at least another instance of the first chip component within at least another unit chip so that the combination of the multiple instances of the first chip component across the multiple unit chips constitute a functional block providing the functionality of a fully functional instance of the first chip component. The stacked semiconductor chip may include multiple instances of a second chip component having a high yield and distributed across the multiple unit chips. Multiple low yield components constitute a functional block providing an enhanced overall yield, while high yield components are utilized to their full potential functionality.
Public/Granted literature
- US20120326333A1 SEMICONDUCTOR CHIP STACKING FOR REDUNDANCY AND YIELD IMPROVEMENT Public/Granted day:2012-12-27
Information query
IPC分类: