Invention Grant
- Patent Title: Process for testing a laser device
- Patent Title (中): 检测激光装置的过程
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Application No.: US12894299Application Date: 2010-09-30
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Publication No.: US08687178B2Publication Date: 2014-04-01
- Inventor: Thomas Deisinger , Christof Donitzky , Claudia Gorschboth , Richard Heimisch , Olaf Kittelmann , Gerhard Robl , Martin Starigk , Klaus Vogler , Mathias Wölfel
- Applicant: Thomas Deisinger , Christof Donitzky , Claudia Gorschboth , Richard Heimisch , Olaf Kittelmann , Gerhard Robl , Martin Starigk , Klaus Vogler , Mathias Wölfel
- Applicant Address: DE Erlangen
- Assignee: Wavelight GmbH
- Current Assignee: Wavelight GmbH
- Current Assignee Address: DE Erlangen
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01J1/42 ; A61F9/008

Abstract:
A process is proposed for testing a laser device that has been set up to emit pulsed focused laser radiation, the focal position of which is adjustable both in and across the direction of propagation of the laser radiation. The laser device includes a contact element that is transparent to the laser radiation, with an abutment surface for abutment of an object to be machined. Within the scope of the process, a test object that is transparent to the laser radiation at least in a machining region is applied onto the abutment surface of the contact element. Then laser radiation is beamed into the test object bearing against the abutment surface and in the process the focal position is moved in accordance with a predetermined test pattern, in order to generate enduring machining structures in the test object.
Public/Granted literature
- US20120080586A1 Process for testing a laser device Public/Granted day:2012-04-05
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