Invention Grant
- Patent Title: Deflection measuring device according to the interferometer principle
- Patent Title (中): 偏转测量装置根据干涉仪原理
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Application No.: US13013862Application Date: 2011-01-26
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Publication No.: US08687199B2Publication Date: 2014-04-01
- Inventor: Henrik Krisch
- Applicant: Henrik Krisch
- Applicant Address: DE Duisburg
- Assignee: KROHNE Messtechnik GmbH
- Current Assignee: KROHNE Messtechnik GmbH
- Current Assignee Address: DE Duisburg
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent David S. Safran
- Priority: DE102010044583 20100907
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
An interferometer type deflection measuring device having a radiation source, a first fiber-optic means forming a first light path, a second fiber-optic means forming a second light path, a deflection body and an evaluation circuit, the first and second fiber-optic means receiving radiation from the radiation source on an input side, and radiation guided in the first and second fiber-optic means, respectively, being brought together on an output side with interference radiation being conveyed to the evaluation circuit for evaluation. The first fiber-optic means and the second fiber-optic means are arranged only on the deflection body, at least one of the first and second fiber-optic means being connected on the input side to the beam source with a single feed optical fiber and at least one of the first and second fiber-optic means being connected on the output side to the evaluation circuit by a single evaluation optical fiber.
Public/Granted literature
- US20120057169A1 DEFLECTION MEASURING DEVICE ACCORDING TO THE INTERFEROMETER PRINCIPLE Public/Granted day:2012-03-08
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