Invention Grant
- Patent Title: Method for detecting facial features
- Patent Title (中): 检测面部特征的方法
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Application No.: US13214497Application Date: 2011-08-22
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Publication No.: US08687855B2Publication Date: 2014-04-01
- Inventor: Jeong Woo Woo , Mallikarjuna Rao Talluri
- Applicant: Jeong Woo Woo , Mallikarjuna Rao Talluri
- Applicant Address: KR Seoul
- Assignee: LG Innotek Co., Ltd.
- Current Assignee: LG Innotek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Saliwanchik, Lloyd & Eisenschenk
- Priority: KR10-2011-0061590 20110624
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
A method for detecting facial feature is provided. Concerned points and concerned areas are extracted from a captured image, and an area which is considered to highly possibly include a facial area is selected. It is determined whether the selected area corresponds to a facial feature by using a support vector machine.
Public/Granted literature
- US20120328199A1 METHOD FOR DETECTING FACIAL FEATURES Public/Granted day:2012-12-27
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