A method of inspecting an organic electroluminescence (EL) display device which includes pixels each of which includes an organic electroluminescence (EL) element includes: imaging the pixels for a predetermined time with a reverse bias voltage being applied to the pixels; identifying light emitting points which produce, in the imaging, light leakage that is greater than or equal to threshold intensity, the light emitting points being located within the pixels; and determining that a pixel including one light emitting point is a defective pixel when, after plural iterations of the imaging and the identifying, the light emitting point is identified in twice or more in the plural iterations of the identifying.