Invention Grant
- Patent Title: Method and apparatus for detection of a fault attack
- Patent Title (中): 用于检测故障攻击的方法和装置
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Application No.: US12943478Application Date: 2010-11-10
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Publication No.: US08688995B2Publication Date: 2014-04-01
- Inventor: Yannick Teglia
- Applicant: Yannick Teglia
- Applicant Address: FR Rousset
- Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee Address: FR Rousset
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: FR0958141 20091118
- Main IPC: H04L9/00
- IPC: H04L9/00

Abstract:
The invention concerns a method of detecting a fault attack including providing a plurality of blinding values; generating a first set of data elements including a first group of data elements and at least one additional data element generated by performing the exclusive OR between at least one data element in the first group and at least one of the blinding values; generating a second set of data elements corresponding to the exclusive OR between each data element of the first set and a selected one of the plurality of blinding values; generating a first signature by performing a commutative operation between each of the data elements of the first set; generating a second signature by performing the commutative operation between each of the data elements of the second set; and comparing the first and second signatures to detect a fault attack.
Public/Granted literature
- US20110119762A1 METHOD AND APPARATUS FOR DETECTION OF A FAULT ATTACK Public/Granted day:2011-05-19
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