Invention Grant
- Patent Title: Detecting device impairment through statistical monitoring
- Patent Title (中): 通过统计监测检测设备损伤
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Application No.: US13192875Application Date: 2011-07-28
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Publication No.: US08689055B2Publication Date: 2014-04-01
- Inventor: Caroline Church , Mark Peter Frost , Dominic John Storey , John Frederick Wesley , Lakshman Sarathchandra Bandara Yatawara
- Applicant: Caroline Church , Mark Peter Frost , Dominic John Storey , John Frederick Wesley , Lakshman Sarathchandra Bandara Yatawara
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Jason H. Sosa
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A tool for detecting potential impairment in an electronic device. The tool classifies the user input into various categories and determines some measurement, typically a rate of input per user or per time, for determining average use statistics of the electronic device. The tool then determines if a calculated measurement based on user inputs deviates from the average use statistics past some threshold level of deviation. In response to surpassing the threshold level of deviation, the tool identifies the electronic device as potentially impaired.
Public/Granted literature
- US20130031422A1 DETECTING DEVICE IMPAIRMENT THROUGH STATISTICAL MONITORING Public/Granted day:2013-01-31
Information query
