Invention Grant
US08689062B2 Systems and methods for parameter selection using reliability information
有权
使用可靠性信息进行参数选择的系统和方法
- Patent Title: Systems and methods for parameter selection using reliability information
- Patent Title (中): 使用可靠性信息进行参数选择的系统和方法
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Application No.: US13251342Application Date: 2011-10-03
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Publication No.: US08689062B2Publication Date: 2014-04-01
- Inventor: Haitao Xia , Shaohua Yang , Kenneth M. Hall , Mark A. Landreth
- Applicant: Haitao Xia , Shaohua Yang , Kenneth M. Hall , Mark A. Landreth
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing system is disclosed that includes: a data detector circuit, and a reliability monitor circuit. The data detector circuit is operable to apply a data detection algorithm to a data set to yield a detected output that includes soft data. The reliability monitor circuit is operable to determine a proxy error count based at least in part on the soft data, and to modify a parameter governing an operation of the data processing system based at least in part on the proxy error count.
Public/Granted literature
- US20130086439A1 Systems and Methods for Parameter Selection Using Reliability Information Public/Granted day:2013-04-04
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