Invention Grant
- Patent Title: Offset error automatic calibration integrated circuit
- Patent Title (中): 偏移误差自动校准集成电路
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Application No.: US13671951Application Date: 2012-11-08
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Publication No.: US08689604B2Publication Date: 2014-04-08
- Inventor: Peter S. Schultz , Sung-Jin Jo
- Applicant: Peter S. Schultz , Sung-Jin Jo
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent James L. Clingan, Jr.
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
An integrated circuit includes a transducer and transducer circuitry and additional elements useful in testing the transducer and transducer circuitry. A first power supply terminal and a second power supply terminal are for being directly connected to an external power supply terminal. A power bus is connected to the first power supply terminal. A logic function is for determining if the second power supply terminal is receiving power and if an automatic calibration test of the transducer and transducer circuitry has been run. An automatic calibration is for running an automatic calibration test on the transducer and transducer circuitry if the logic means determines that the second power supply terminal is receiving power and the automatic calibration test of the transducer and transducer circuitry has not been run.
Public/Granted literature
- US20130061649A1 OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT Public/Granted day:2013-03-14
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