Invention Grant
- Patent Title: Manufacturing method of semiconductor device and semiconductor device
- Patent Title (中): 半导体器件和半导体器件的制造方法
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Application No.: US13427200Application Date: 2012-03-22
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Publication No.: US08691699B2Publication Date: 2014-04-08
- Inventor: Tsuyoshi Kanki , Shoichi Suda , Shinya Sasaki
- Applicant: Tsuyoshi Kanki , Shoichi Suda , Shinya Sasaki
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2011-086422 20110408
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A manufacturing method of a semiconductor device includes: forming an insulating layer above a substrate; forming a recessed section in the insulating layer; forming, on the insulating layer, a mask pattern having a first opening which exposes the recessed section, and a second opening which is arranged outside the first opening and does not expose the recessed section; forming a first conductive member and a second conductive member by respectively depositing a conductive material in the first opening and the second opening; and polishing and removing the first conductive member and the second conductive member on the upper side of the insulating layer so as to leave the first conductive member in the recessed section.
Public/Granted literature
- US20120273964A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2012-11-01
Information query
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