Invention Grant
US08692064B2 Quantitative trait loci associated with soybean cyst nematode resistance and methods of their use
有权
与大豆孢囊线虫抗性相关的定量性状位点及其使用方法
- Patent Title: Quantitative trait loci associated with soybean cyst nematode resistance and methods of their use
- Patent Title (中): 与大豆孢囊线虫抗性相关的定量性状位点及其使用方法
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Application No.: US12896864Application Date: 2010-10-02
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Publication No.: US08692064B2Publication Date: 2014-04-08
- Inventor: Henry T. Nguyen , David A. Sleper , James G. Shannon , Tri D. Vuong , Xiaolei Wu
- Applicant: Henry T. Nguyen , David A. Sleper , James G. Shannon , Tri D. Vuong , Xiaolei Wu
- Applicant Address: US MO Columbia
- Assignee: The Curators of the University of Missouri
- Current Assignee: The Curators of the University of Missouri
- Current Assignee Address: US MO Columbia
- Agency: Lathrop & Gage LLP
- Agent Dan Cleveland, Jr.
- Main IPC: A01H1/00
- IPC: A01H1/00 ; A01H1/04
Abstract:
Several QTLs that are genetically linked to resistance to soybean cyst nematode (SCN) are disclosed. These QTLs have been mapped to genomic regions on Chrs. 4, 8, 10, 11, 18, and 20 of soybean, G. max. Candidate genes underlying these QTLs as defined by the flanking markers, as well as genetic markers associated with these QTLs are also disclosed. These markers can be utilized for introgressing SCN resistance into non-resistant soybean germplasm. The unique resistance genes can be introduced into a non-resistant plant by marker-assisted selection (MAS) or by transgenic methods.
Public/Granted literature
- US20110083234A1 Quantitative Trait Loci Associated With Soybean Cyst Nematode Resistance And Methods Of Their Use Public/Granted day:2011-04-07
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