Invention Grant
- Patent Title: Concept for determining a measurement value at a component
- Patent Title (中): 用于确定组件测量值的概念
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Application No.: US12277479Application Date: 2008-11-25
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Publication No.: US08692199B2Publication Date: 2014-04-08
- Inventor: Juergen Huppertz
- Applicant: Juergen Huppertz
- Applicant Address: DE Munich
- Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Current Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Current Assignee Address: DE Munich
- Agency: Keating & Bennett, LLP
- Priority: DE102007056731 20071126
- Main IPC: G01J5/22
- IPC: G01J5/22
Abstract:
In an evaluation device for determining a measurement value at a component, power is supplied to the component during readout of the measurement value. A controller serves to determine the power supplied to the component during the readout. The measurement value determined by the reader is corrected by a compensator while using the power determined by the controller, so as to obtain a corrected measurement value freed from any effects caused by the power supplied.
Public/Granted literature
- US20090134330A1 CONCEPT FOR DETERMINING A MEASUREMENT VALUE AT A COMPONENT Public/Granted day:2009-05-28
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