Invention Grant
- Patent Title: Resistive memory device and fabrication method thereof
- Patent Title (中): 电阻式存储器件及其制造方法
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Application No.: US13601819Application Date: 2012-08-31
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Publication No.: US08692225B2Publication Date: 2014-04-08
- Inventor: Nam Kyun Park
- Applicant: Nam Kyun Park
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2012-0055454 20120524
- Main IPC: H01L29/06
- IPC: H01L29/06

Abstract:
A resistive memory device capable of suppressing disturbance between cells and a fabrication method thereof are provided. The resistive memory device includes a word line formed, in a first direction, on a semiconductor substrate, lower access structures, each having a pillar shape, formed on the word line, a first insulating layer formed around an outer circumference of each of the lower access structures, a heat-absorption layer formed on a surface of each of the to heat-absorption layers, a variable resistive material formed on the lower access structures, and an upper electrode formed on each variable resistive material.
Public/Granted literature
- US20130313504A1 RESISTIVE MEMORY DEVICE AND FABRICATION METHOD THEREOF Public/Granted day:2013-11-28
Information query
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