Invention Grant
- Patent Title: Input device transmitter path error diagnosis
- Patent Title (中): 输入设备发射机路径错误诊断
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Application No.: US13012943Application Date: 2011-01-25
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Publication No.: US08692794B2Publication Date: 2014-04-08
- Inventor: Wen Fang
- Applicant: Wen Fang
- Applicant Address: US CA San Jose
- Assignee: Synaptics Incorporated
- Current Assignee: Synaptics Incorporated
- Current Assignee Address: US CA San Jose
- Main IPC: G06F3/045
- IPC: G06F3/045

Abstract:
A processing system configured for capacitive sensing comprises transmitter circuitry, a first internal diagnostic mechanism, and a determination module. The transmitter circuitry is configured to transmit during a first time period with a first transmitter path of a plurality of transmitter paths in an input device. Each transmitter path of the plurality of transmitter paths is configured for capacitive sensing. The first internal diagnostic mechanism comprises a selectable leakage path. The selectable leakage path is configured to be coupled with the transmitter circuitry. The determination module is configured to determine if a discontinuity exists within the first transmitter path based on a discharge rate for the first transmitter path. The discharge rate is acquired during a second time period via the selectable leakage path of the first internal diagnostic mechanism, wherein the second time period occurs after the first time period.
Public/Granted literature
- US20120188195A1 INPUT DEVICE TRANSMITTER PATH ERROR DIAGNOSIS Public/Granted day:2012-07-26
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