Invention Grant
US08693000B2 Quantitative phase microscopy for label-free high-contrast cell imaging
有权
用于无标记的高对比度细胞成像的定量相位显微术
- Patent Title: Quantitative phase microscopy for label-free high-contrast cell imaging
- Patent Title (中): 用于无标记的高对比度细胞成像的定量相位显微术
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Application No.: US13335748Application Date: 2011-12-22
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Publication No.: US08693000B2Publication Date: 2014-04-08
- Inventor: Evgenia Mikhailovna Kim , Robert John Fikins , Chulmin Joo
- Applicant: Evgenia Mikhailovna Kim , Robert John Fikins , Chulmin Joo
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jenifer Haeckl
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G02B21/00
Abstract:
Systems and methods described herein employ multiple phase-contrast images with various relative phase shifts between light diffracted by a sample and light not diffracted by the sample to produce a quantitative phase image. The produced quantitative phase image may have sufficient contrast for label-free auto-segmentation of cell bodies and nuclei.
Public/Granted literature
- US20130163002A1 Quantitative Phase Microscopy For Label-Free High-Contrast Cell Imaging Public/Granted day:2013-06-27
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