Invention Grant
US08693252B2 Method and system for adjusting read voltage in flash memory device
有权
调整闪存设备读取电压的方法和系统
- Patent Title: Method and system for adjusting read voltage in flash memory device
- Patent Title (中): 调整闪存设备读取电压的方法和系统
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Application No.: US13543902Application Date: 2012-07-09
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Publication No.: US08693252B2Publication Date: 2014-04-08
- Inventor: Kui-Yon Mun
- Applicant: Kui-Yon Mun
- Applicant Address: unknown Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: unknown Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2011-0068792 20110712
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A method is provided for adjusting a read voltage in a flash memory device. The method includes storing first program count information when first pages of flash memory cells are programmed, the first program count information indicating a number of bits having a first logic value from among bits of data programmed in the first pages of the flash memory cells, and obtaining first read count information by counting a number of bits having the first logic value from among bits of data read from the first pages of the flash memory cells, while reading data from the flash memory cells using read voltages. The read voltages are adjusted based on the difference between the first read count information and the first program count information.
Public/Granted literature
- US20130016562A1 METHOD AND SYSTEM FOR ADJUSTING READ VOLTAGE IN FLASH MEMORY DEVICE Public/Granted day:2013-01-17
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