A semiconductor device includes a charge pump circuit that generates a first voltage during a first period and a second voltage during a second period following the first period by a boosting operation, a load current application circuit that includes a first memory cell, and that applies the first voltage to the first memory cell, a memory circuit that includes a second memory cell, and that applies the second voltage to the second memory cell; and a voltage detection circuit that monitors a value of the first voltage to determine whether or not the first voltage is increased to the predetermined voltage, wherein the charge pump circuit stops the boosting operation if the first voltage is less than the predetermined voltage at an end of the first period.