Invention Grant
US08693338B2 Quality measuring system, quality measuring apparatus, quality measuring method, and program
失效
质量测量系统,质量测量仪器,质量测量方法和程序
- Patent Title: Quality measuring system, quality measuring apparatus, quality measuring method, and program
- Patent Title (中): 质量测量系统,质量测量仪器,质量测量方法和程序
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Application No.: US12396016Application Date: 2009-03-02
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Publication No.: US08693338B2Publication Date: 2014-04-08
- Inventor: Ryuichi Ikematsu , Hiroyuki Takagi , Kazuo Takagi , Zhenlong Cui
- Applicant: Ryuichi Ikematsu , Hiroyuki Takagi , Kazuo Takagi , Zhenlong Cui
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Main IPC: H04L1/00
- IPC: H04L1/00

Abstract:
An exemplary object of the present invention lies in a point of providing a technology capable of measuring a transmission quality of an Ethernet network in order to utilize Ethernet as carrier-grade communication. The present invention includes an error bit number measurer for measuring the number of error bits that have occurred for a frame of Ethernet, being a target of monitoring, within a monitoring period, a transmitted bit number measurer for measuring the number of total transmitted bits of Ethernet frames that a device facing it has transmitted within the foregoing monitoring period, and a bit error rate operator for obtaining a bit error rate of a transmission path by employing a measurement result by the foregoing error bit number measurer and the foregoing transmitted bit number measurer.
Public/Granted literature
- US20100220612A1 QUALITY MEASURING SYSTEM, QUALITY MEASURING APPARATUS, QUALITY MEASURING METHOD, AND PROGRAM Public/Granted day:2010-09-02
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