Invention Grant
- Patent Title: Eyelid detection device and program
- Patent Title (中): 眼睑检测装置及程序
-
Application No.: US13805597Application Date: 2011-07-06
-
Publication No.: US08693784B2Publication Date: 2014-04-08
- Inventor: Akira Kadoya , Satoru Nakanishi , Shinichi Kojima
- Applicant: Akira Kadoya , Satoru Nakanishi , Shinichi Kojima
- Applicant Address: JP Aichi-ken
- Assignee: Aisin Seiki Kabushiki Kaisha
- Current Assignee: Aisin Seiki Kabushiki Kaisha
- Current Assignee Address: JP Aichi-ken
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-160053 20100714
- International Application: PCT/JP2011/065509 WO 20110706
- International Announcement: WO2012/008345 WO 20120119
- Main IPC: G06K9/48
- IPC: G06K9/48 ; G06K9/46 ; G06K9/40 ; G06K9/00

Abstract:
An eyelid detection device that, based on first order differential values and second order differential values of vertical density change at an eyelid boundary in an eye image, shifts the second order differential values upwards by ¼ of the cycle of density change frequency of an eyelid boundary and combines the first order differential values and the second order differential values to compute upper eyelid feature amounts. The eyelid detection device detects a boundary between an upper eyelid and eyeball based on peak points in the vertical direction of the computed upper eyelid feature amounts. Consequently, the boundary between an eyelid and eyeball can be accurately detected even when the eyelid has been applied with makeup.
Public/Granted literature
- US20130101225A1 EYELID DETECTION DEVICE AND PROGRAM Public/Granted day:2013-04-25
Information query