Invention Grant
- Patent Title: Terminal metal connection inspection
- Patent Title (中): 端子金属连接检查
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Application No.: US13736631Application Date: 2013-01-08
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Publication No.: US08694936B1Publication Date: 2014-04-08
- Inventor: Jeanne P. S. Bickford , Donald S. Kent , Gerard John Nuzback
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Richard M. Kotulak
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Various embodiments include computer-implemented methods, computer program products and systems for terminal metal connector inspection. In some embodiments, a computer-implemented method for identifying a set of critical terminal metal connectors (TMCs) in an integrated circuit (IC) layout includes: identifying a group of necessary terminal metal connectors (TMCs) in the IC layout to form a first portion of the set of critical TMCs; forming a rule including a limit on a number of redundant connections that can be noncompliant between each terminal metal connector (TMC) and a connecting surface in the IC layout without impacting a circuit parameter; and inspecting at least one of the IC layout or the connecting surface to identify each TMC that violates the rule, wherein each identified TMC that violates the rule forms a second portion of the set of critical TMCs.
Information query