Invention Grant
US08696201B2 Device and method for calibrating an X-ray detector, calibration apparatus and X-ray apparatus
失效
用于校准X射线检测器,校准装置和X射线装置的装置和方法
- Patent Title: Device and method for calibrating an X-ray detector, calibration apparatus and X-ray apparatus
- Patent Title (中): 用于校准X射线检测器,校准装置和X射线装置的装置和方法
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Application No.: US13293179Application Date: 2011-11-10
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Publication No.: US08696201B2Publication Date: 2014-04-15
- Inventor: Edgar Kraft , Björn Kreisler
- Applicant: Edgar Kraft , Björn Kreisler
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102010044176 20101119
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
A device and a method are disclosed, for energetic calibration of a photon-counting X-ray radiation detector by way of X-ray fluorescence radiation. The device includes a plurality of specifically selected elements, of which each element, upon being irradiated with electrons or with high-energy radiation, emits photons of X-ray fluorescence radiation of at least one specific or characteristic energy. The photons of X-ray fluorescence radiation of the at least one specific or characteristic energy are then useable or are used for energetic calibration of the photon-counting X-ray radiation detector. A calibration apparatus and an X-ray apparatus are also disclosed, which include such a device.
Public/Granted literature
- US20120128131A1 Device And Method For Calibrating An X-Ray Detector, Calibration Apparatus And X-Ray Apparatus Public/Granted day:2012-05-24
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