Invention Grant
US08698076B2 Differential mobility analyzer, particle measuring system, and particle sorting system
有权
差分迁移率分析仪,粒子测量系统和粒子分选系统
- Patent Title: Differential mobility analyzer, particle measuring system, and particle sorting system
- Patent Title (中): 差分迁移率分析仪,粒子测量系统和粒子分选系统
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Application No.: US12979415Application Date: 2010-12-28
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Publication No.: US08698076B2Publication Date: 2014-04-15
- Inventor: Takaaki Orii , Satoshi Kudoh
- Applicant: Takaaki Orii , Satoshi Kudoh
- Applicant Address: JP Wako-shi
- Assignee: Riken
- Current Assignee: Riken
- Current Assignee Address: JP Wako-shi
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2010-021552 20100202
- Main IPC: H01J49/48
- IPC: H01J49/48

Abstract:
In order to provide a differential mobility analyzer and the like that allows (i) easy increase of an upper limit of particle size of charged particle which can be classified and (ii) analysis of charged particles whose particle size is variable, a DMA (Differential Mobility Analyzer) includes: a classification tank in which an inlet electrode having an inlet slit, an intermediate electrode having a slit, and an outlet electrode having an outlet slit are arranged in sequence in such a manner that adjacent electrodes are disposed opposing each other at predetermined intervals; a gas supply section supplying the classification tank with sheath gas; and a voltage generator applying a predetermined voltage between the electrodes disposed opposing each other, the classification tank including a first classification section and a second classification section each formed by the electrodes disposed opposing each other, and the gas supply section controlling a flow rate of the sheath gas to be supplied to the classification tank individually per first classification section and second classification section.
Public/Granted literature
- US20120001067A1 DIFFERENTIAL MOBILITY ANALYZER, PARTICLE MEASURING SYSTEM, AND PARTICLE SORTING SYSTEM Public/Granted day:2012-01-05
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