Invention Grant
US08698083B2 Solar cell evaluation method, evaluation device, maintenance method, maintenance system, and method of manufacturing solar cell module
有权
太阳能电池评估方法,评估装置,维护方法,维护系统以及制造太阳能电池组件的方法
- Patent Title: Solar cell evaluation method, evaluation device, maintenance method, maintenance system, and method of manufacturing solar cell module
- Patent Title (中): 太阳能电池评估方法,评估装置,维护方法,维护系统以及制造太阳能电池组件的方法
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Application No.: US13388129Application Date: 2010-08-03
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Publication No.: US08698083B2Publication Date: 2014-04-15
- Inventor: Takashi Fuyuki , Ayumi Tani
- Applicant: Takashi Fuyuki , Ayumi Tani
- Applicant Address: JP Nara
- Assignee: National University Corporation Nara Institute of Science and Technology
- Current Assignee: National University Corporation Nara Institute of Science and Technology
- Current Assignee Address: JP Nara
- Agency: Nixon & Vanderhye P.C.
- Priority: JP2009-181850 20090804
- International Application: PCT/JP2010/063073 WO 20100803
- International Announcement: WO2011/016441 WO 20110210
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01N21/00 ; G01N21/66 ; G01R31/26 ; G01N21/95

Abstract:
A method and device for evaluating a solar cell each of which makes it possible to easily evaluate a defect of a solar cell especially in such a manner that an internal cause defect and an external cause defect are distinguished from each other. The device includes: electric current passing means for passing, in a forward direction, an electric current through a solar cell element constituting the solar cell; light emission detecting means for detecting, out of light emitted from the solar cell element due to the electric current passed by the electric current passing means, light in a first range of wavelengths from 800 nm to 1300 nm and light in a second range of wavelengths from 1400 nm to 1800 nm; and judging means for distinguishing between an internal cause defect and an external cause defect.
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