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US08698090B2 Practical SPECT calibration method for quantification of nuclides with high-energy contributions 失效
实际的SPECT校准方法用于量化具有高能量贡献的核素

  • Patent Title: Practical SPECT calibration method for quantification of nuclides with high-energy contributions
  • Patent Title (中): 实际的SPECT校准方法用于量化具有高能量贡献的核素
  • Application No.: US13120662
    Application Date: 2009-10-05
  • Publication No.: US08698090B2
    Publication Date: 2014-04-15
  • Inventor: Henrik Botterweck
  • Applicant: Henrik Botterweck
  • Applicant Address: NL Eindhoven
  • Assignee: Koninklijke Philips N.V.
  • Current Assignee: Koninklijke Philips N.V.
  • Current Assignee Address: NL Eindhoven
  • International Application: PCT/IB2009/054352 WO 20091005
  • International Announcement: WO2010/041192 WO 20100415
  • Main IPC: G01D18/00
  • IPC: G01D18/00 H01L27/146 G06F7/60
Practical SPECT calibration method for quantification of nuclides with high-energy contributions
Abstract:
When calibrating a nuclear camera, such as a SPECT camera, point spread functions (PSF) are simulated for all possible photon energies and detection distances that the camera may experience. During manufacturer-side calibration, a point source (14) is imaged by the nuclear camera and a PSF therefor is measured. The measured PSF is compared to one or more simulated PSFs and a difference therebetween is determined. To calibrate the measured PSF, simulated PSF data is interpolated into the measured PSF to minimize the difference between the measured and simulated PSFs. The calibrated PSF is stored to memory and accessed during user-side calibration. A user then images a tracer sample during a routine camera calibration, and a PSF for the tracer sample is compared to the calibrated PSF to determine a level of contamination in the tracer sample. The tracer sample PSF is then calibrated for use in reconstructing nuclear images.
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