Invention Grant
US08698107B2 Technique and apparatus for monitoring ion mass, energy, and angle in processing systems
有权
用于监控处理系统中离子质量,能量和角度的技术和设备
- Patent Title: Technique and apparatus for monitoring ion mass, energy, and angle in processing systems
- Patent Title (中): 用于监控处理系统中离子质量,能量和角度的技术和设备
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Application No.: US12987950Application Date: 2011-01-10
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Publication No.: US08698107B2Publication Date: 2014-04-15
- Inventor: Ludovic Godet , Christopher J. Leavitt , Bon-Woong Koo , Anthony Renau
- Applicant: Ludovic Godet , Christopher J. Leavitt , Bon-Woong Koo , Anthony Renau
- Applicant Address: US MA Gloucester
- Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee Address: US MA Gloucester
- Main IPC: H01J37/30
- IPC: H01J37/30

Abstract:
A time-of-flight (TOF) ion sensor system for monitoring an angular distribution of ion species having an ion energy and incident on a substrate includes a drift tube wherein the ion sensor system is configured to vary an angle of the drift tube with respect to a plane of the substrate. The drift tube may have a first end configured to receive a pulse of ions from the ion species wherein heavier ions and lighter ions of the pulse of ions arrive in packets at a second end of the drift tube. An ion detector may be disposed at the second end of the ion sensor, wherein the ion detector is configured to detect the packets of ions derived from the pulse of ions and corresponding to respective different ion masses.
Public/Granted literature
- US20120175518A1 TECHNIQUE AND APPARATUS FOR MONITORING ION MASS, ENERGY, AND ANGLE IN PROCESSING SYSTEMS Public/Granted day:2012-07-12
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