Invention Grant
- Patent Title: Semiconductor device having concentration difference of impurity element in semiconductor films
- Patent Title (中): 具有半导体膜中的杂质元素的浓度差的半导体装置
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Application No.: US13186041Application Date: 2011-07-19
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Publication No.: US08698220B2Publication Date: 2014-04-15
- Inventor: Yoshinobu Asami
- Applicant: Yoshinobu Asami
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2007-046807 20070227
- Main IPC: H01L27/13
- IPC: H01L27/13

Abstract:
To provide a semiconductor device having a memory element, and which is manufactured by a simplified manufacturing process. A method of manufacturing a semiconductor device includes, forming a first insulating film to cover a first semiconductor film and a second semiconductor film; forming a first conductive film and a second conductive film over the first semiconductor film and the second semiconductor film, respectively, with the first insulating film interposed therebetween; forming a second insulating film to cover the first conductive film; forming a third conductive film selectively over the first conductive film which is formed over the first semiconductor film, with the second insulating film interposed therebetween, and doping the first semiconductor film with an impurity element with the third conductive film serving as a mask and doping the second semiconductor film with the impurity element through the second conductive film.
Public/Granted literature
- US20110272752A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2011-11-10
Information query
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