Invention Grant
- Patent Title: Over-voltage and over-temperature detecting circuit
- Patent Title (中): 过电压和过温检测电路
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Application No.: US12973389Application Date: 2010-12-20
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Publication No.: US08698484B2Publication Date: 2014-04-15
- Inventor: Chin-Tsai Chiang
- Applicant: Chin-Tsai Chiang
- Applicant Address: TW Taoyuan Hsien
- Assignee: Delta Electronics, Inc.
- Current Assignee: Delta Electronics, Inc.
- Current Assignee Address: TW Taoyuan Hsien
- Agency: Kirton McConkie
- Agent Evan R. Witt
- Priority: TW98144328A 20091222
- Main IPC: G01R19/165
- IPC: G01R19/165

Abstract:
An over-voltage and over-temperature detecting circuit includes a voltage-limiting circuit, a temperature sensing circuit, a current source, a first comparing circuit and a second comparing circuit. The equivalent resistance of the temperature sensing circuit varies with the temperature. The current source provides a first current to a detecting terminal, so that a detecting voltage is generated at the detecting terminal. By comparing the magnitude of the detecting voltage with the first reference voltage value, the first comparing circuit generates a corresponding temperature status signal. By comparing the magnitude of the detecting voltage with the second reference voltage value, the second comparing circuit generates a corresponding voltage status signal. If the temperature exceeds the temperature upper limit, the temperature status signal is in an enabling status. If the first voltage exceeds the voltage upper limit, the voltage status signal is in an enabling status.
Public/Granted literature
- US20110148395A1 OVER-VOLTAGE AND OVER-TEMPERATURE DETECTING CIRCUIT Public/Granted day:2011-06-23
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